gcc/testsuite/gcc.dg/tree-ssa/pr64910-2.c

   1 /* { dg-do compile } */
   2 /* { dg-options "-O2 -fdump-tree-reassoc1" } */
   3
   4 /* We want to make sure that we reassociate in a way that has the
   5    constant last.  With the constant last, it's more likely to result
   6    in a bitfield test on targets with such capabilities.  */
   7
   8 extern void boo ();
   9
  10 int b2b_uc (unsigned char u, unsigned char w)
  11 {
  12   if ((u & w) & 0x20)
  13     boo ();
  14 }
  15
  16 int b2b_us (unsigned short u, unsigned short w)
  17 {
  18   if ((u & w) & 0x20)
  19     boo ();
  20 }
  21
  22 int b2b_ui (unsigned int u, unsigned int w)
  23 {
  24   if ((u & w) & 0x20)
  25     boo ();
  26 }
  27 int b2b_ul (unsigned long u, unsigned long w)
  28 {
  29   if ((u & w) & 0x20)
  30     boo ();
  31 }
  32 int b2b_ull (unsigned long long u, unsigned long long w)
  33 {
  34   if ((u & w) & 0x20)
  35     boo ();
  36 }
  37
  38 int b2b_sc (signed char u, signed char w)
  39 {
  40   if ((u & w) & 0x20)
  41     boo ();
  42 }
  43
  44 int b2b_ss (signed short u, signed short w)
  45 {
  46   if ((u & w) & 0x20)
  47     boo ();
  48 }
  49
  50 int b2b_si (signed int u, signed int w)
  51 {
  52   if ((u & w) & 0x20)
  53     boo ();
  54 }
  55 int b2b_sl (signed long u, signed long w)
  56 {
  57   if ((u & w) & 0x20)
  58     boo ();
  59 }
  60 int b2b_sll (signed long long u, signed long long w)
  61 {
  62   if ((u & w) & 0x20)
  63     boo ();
  64 }
  65
  66 /* The AND of U & W should go into a temporary, when is then ANDed
  67    with the constant.
  68
  69    First verify that we have the right number of ANDs between U and W.  */
  70 /* { dg-final { scan-tree-dump-times "\[uw\]_\[0-9\]+.D. \& \[uw\]_\[0-9\]+.D.;" 10 "reassoc1"} } */
  71
  72 /* Then verify that we have the right number of ANDS between a temporary
  73    and the constant.  */
  74 /* { dg-final { scan-tree-dump-times "_\[0-9]+ \& 32;" 10 "reassoc1"} } */
  75
  76 /* Each function has one AND.  It will have either a second AND or TEST.  So
  77    we can count the number of AND and TEST instructions.  They must be 2X
  78    the number of test functions in this file.  */
  79 /* { dg-final { scan-assembler-times "and|test" 20 { target { i?86-*-* x86_64-*-*} } } } */
  80
  81 /* Similarly on the m68k.  The code for the long long tests is suboptimal,
  82    which catch via the second pattern and xfail.  */
  83 /* { dg-final { scan-assembler-times "and|btst" 20 { target { m68k-*-* } } } } */
  84 /* { dg-final { scan-assembler-not "or" { target { m68k-*-* } xfail { *-*-* } } } } */
  85