gcc/testsuite/gcc.target/aarch64/sve/strided_store_5.c

   1 /* { dg-do assemble { target aarch64_asm_sve_ok } } */
   2 /* { dg-options "-O2 -ftree-vectorize -msve-vector-bits=256 --save-temps" } */
   3
   4 #include <stdint.h>
   5
   6 #define TEST_LOOP(DATA_TYPE, NAME, SCALE)                       \
   7   void __attribute__ ((noinline, noclone))                      \
   8   f_##DATA_TYPE##_##NAME (DATA_TYPE *restrict dest,             \
   9                           DATA_TYPE *restrict src, long n)      \
  10   {                                                             \
  11     for (long i = 0; i < n; ++i)                                \
  12       dest[i * SCALE] = src[i] + 1;                             \
  13   }
  14
  15 #define TEST_TYPE(T, DATA_TYPE)                 \
  16   T (DATA_TYPE, 5, 5)                           \
  17   T (DATA_TYPE, 7, 7)                           \
  18   T (DATA_TYPE, 11, 11)                         \
  19   T (DATA_TYPE, 200, 200)                       \
  20   T (DATA_TYPE, m100, -100)
  21
  22 #define TEST_ALL(T)                             \
  23   TEST_TYPE (T, int32_t)                        \
  24   TEST_TYPE (T, uint32_t)                       \
  25   TEST_TYPE (T, float)                          \
  26   TEST_TYPE (T, int64_t)                        \
  27   TEST_TYPE (T, uint64_t)                       \
  28   TEST_TYPE (T, double)
  29
  30 TEST_ALL (TEST_LOOP)
  31
  32 /* { dg-final { scan-assembler-times {\tst1w\tz[0-9]+\.s, p[0-7], \[x[0-9]+, z[0-9]+.s, uxtw\]\n} 12 } } */
  33 /* { dg-final { scan-assembler-times {\tst1w\tz[0-9]+\.s, p[0-7], \[x[0-9]+, z[0-9]+.s, sxtw\]\n} 3 } } */
  34 /* { dg-final { scan-assembler-times {\tst1d\tz[0-9]+\.d, p[0-7], \[x[0-9]+, z[0-9]+.d\]\n} 15 } } */