gcc/testsuite/gcc.target/i386/avx512f-kortestw-1.c

   1 /* { dg-do compile } */
   2 /* { dg-options "-O0 -mavx512f" } */
   3 /* { dg-final { scan-assembler-times "kortestw\[ \\t\]+\[^\{\n\]*%k\[0-7\](?:\n|\[ \\t\]+#)" 6 } } */
   4
   5 #include <immintrin.h>
   6
   7 void
   8 avx512f_test () {
   9   volatile __mmask16 k1 = 0;
  10   __mmask16 k2 = 0;
  11   volatile __mmask8 k3 = 0;
  12   __mmask8 k4 = 0;
  13
  14   volatile short r __attribute__((unused));
  15
  16   /* Check that appropriate insn sequence is generated at -O0.  */
  17   r = _mm512_kortestc (k1, k2);
  18   r = _mm512_kortestz (k1, k2);
  19
  20   r = _mm512_kortestc (k3, k4);
  21   r = _mm512_kortestz (k3, k4);
  22
  23   volatile unsigned char r1 __attribute__((unused));
  24
  25   r1 = _kortestc_mask16_u8(k1, k2);
  26   r1 = _kortestz_mask16_u8(k1, k2);
  27 }