[ARM] Fix test armv8_2-fp16-move-1.c
[official-gcc.git] / gcc / testsuite / gcc.target / arm / volatile-bitfields-4.c
blob4256965344de3a76205a2bd0d4ba48cf99ac880b
1 /* { dg-do compile } */
2 /* { dg-require-effective-target arm_eabi } */
3 /* { dg-options "-O2" } */
4 /* { dg-final { scan-assembler-times "ldr\[\\t \]+\[^\n\]*,\[\\t \]*\\\[\[^\n\]*\\\]" 2 } } */
5 /* { dg-final { scan-assembler-times "str\[\\t \]+\[^\n\]*,\[\\t \]*\\\[\[^\n\]*\\\]" 2 } } */
6 /* { dg-final { scan-assembler-not "strb" } } */
8 struct thing {
9 unsigned a: 8;
10 unsigned b: 8;
11 unsigned c: 8;
12 unsigned d: 8;
15 struct thing2 {
16 volatile unsigned a: 8;
17 volatile unsigned b: 8;
18 volatile unsigned c: 8;
19 volatile unsigned d: 8;
22 void test1(volatile struct thing *t)
24 t->a = 5;
27 void test2(struct thing2 *t)
29 t->a = 5;