[AArch64] Fix SVE testsuite failures for ILP32 (PR 83846)
[official-gcc.git] / gcc / testsuite / gcc.target / aarch64 / sve / spill_1.c
blob8039f5526aa22daf23b7a74af181af5e9f49f3d9
1 /* { dg-do compile } */
2 /* { dg-options "-O2 -ftree-vectorize" } */
4 #include <stdint.h>
6 void consumer (void *);
8 #define TEST_LOOP(TYPE, VAL) \
9 void \
10 double_loop_##TYPE (TYPE *x) \
11 { \
12 for (int i = 0; i < 100; ++i) \
13 x[i] += VAL; \
14 consumer (x); \
15 for (int i = 0; i < 100; ++i) \
16 x[i] += VAL; \
17 consumer (x); \
20 TEST_LOOP (uint16_t, 511);
21 TEST_LOOP (uint32_t, 511);
22 TEST_LOOP (uint64_t, 511);
24 /* { dg-final { scan-assembler-times {\tmov\tz[0-9]+\.h, #511\n} 2 } } */
25 /* { dg-final { scan-assembler-times {\tmov\tz[0-9]+\.s, #511\n} 2 } } */
26 /* { dg-final { scan-assembler-times {\tmov\tz[0-9]+\.d, #511\n} 2 } } */
27 /* { dg-final { scan-assembler-not {\tldr\tz[0-9]} } } */
28 /* { dg-final { scan-assembler-not {\tstr\tz[0-9]} } } */
29 /* { dg-final { scan-assembler-not {\tldr\tp[0-9]} } } */
30 /* { dg-final { scan-assembler-not {\tstr\tp[0-9]} } } */