gcc/testsuite/gcc.target/aarch64/sve/scatter_store_6.c

   1 /* { dg-do assemble { target aarch64_asm_sve_ok } } */
   2 /* { dg-options "-O2 -ftree-vectorize -fwrapv --save-temps" } */
   3
   4 #include <stdint.h>
   5
   6 #ifndef INDEX32
   7 #define INDEX16 int16_t
   8 #define INDEX32 int32_t
   9 #endif
  10
  11 /* Invoked 18 times for each data size.  */
  12 #define TEST_LOOP(DATA_TYPE, BITS)                                      \
  13   void __attribute__ ((noinline, noclone))                              \
  14   f_##DATA_TYPE (DATA_TYPE *restrict dest, DATA_TYPE *restrict src,     \
  15                  INDEX##BITS *indices, INDEX##BITS mask, int n)         \
  16   {                                                                     \
  17     for (int i = 9; i < n; ++i)                                         \
  18       dest[(INDEX##BITS) (indices[i] | mask)] = src[i] + 1;             \
  19   }
  20
  21 #define TEST_ALL(T)                             \
  22   T (int32_t, 16)                               \
  23   T (uint32_t, 16)                              \
  24   T (float, 16)                                 \
  25   T (int64_t, 32)                               \
  26   T (uint64_t, 32)                              \
  27   T (double, 32)
  28
  29 TEST_ALL (TEST_LOOP)
  30
  31 /* { dg-final { scan-assembler-times {\tsunpkhi\tz[0-9]+\.s, z[0-9]+\.h\n} 3 } } */
  32 /* { dg-final { scan-assembler-times {\tsunpklo\tz[0-9]+\.s, z[0-9]+\.h\n} 3 } } */
  33 /* { dg-final { scan-assembler-times {\tsunpkhi\tz[0-9]+\.d, z[0-9]+\.s\n} 3 } } */
  34 /* { dg-final { scan-assembler-times {\tsunpklo\tz[0-9]+\.d, z[0-9]+\.s\n} 3 } } */
  35 /* { dg-final { scan-assembler-times {\tst1w\tz[0-9]+\.s, p[0-7], \[x[0-9]+, z[0-9]+.s, sxtw 2\]\n} 6 } } */
  36 /* { dg-final { scan-assembler-times {\tst1d\tz[0-9]+\.d, p[0-7], \[x[0-9]+, z[0-9]+.d, lsl 3\]\n} 6 } } */