gcc/testsuite/gcc.target/aarch64/sve/index_offset_1.c

   1 /* { dg-do compile } */
   2 /* { dg-options "-O2 -ftree-vectorize -msve-vector-bits=256" } */
   3
   4 #define SIZE (15 * 8 + 3)
   5
   6 #define DEF_INDEX_OFFSET(SIGNED, TYPE, ITERTYPE)                        \
   7 void __attribute__ ((noinline, noclone))                                \
   8 set_##SIGNED##_##TYPE##_##ITERTYPE (SIGNED TYPE *restrict out,          \
   9                                     SIGNED TYPE *restrict in)           \
  10 {                                                                       \
  11   SIGNED ITERTYPE i;                                                    \
  12   for (i = 0; i < SIZE; i++)                                            \
  13   {                                                                     \
  14     out[i] = in[i];                                                     \
  15   }                                                                     \
  16 }                                                                       \
  17 void __attribute__ ((noinline, noclone))                                \
  18 set_##SIGNED##_##TYPE##_##ITERTYPE##_var (SIGNED TYPE *restrict out,    \
  19                                           SIGNED TYPE *restrict in,     \
  20                                           SIGNED ITERTYPE n)            \
  21 {                                                                       \
  22   SIGNED ITERTYPE i;                                                    \
  23   for (i = 0; i < n; i++)                                               \
  24   {                                                                     \
  25     out[i] = in[i];                                                     \
  26   }                                                                     \
  27 }
  28
  29 #define TEST_TYPE(T, SIGNED, TYPE)              \
  30   T (SIGNED, TYPE, char)                        \
  31   T (SIGNED, TYPE, short)                       \
  32   T (SIGNED, TYPE, int)                         \
  33   T (SIGNED, TYPE, long)
  34
  35 #define TEST_ALL(T)                             \
  36   TEST_TYPE (T, signed, long)                   \
  37   TEST_TYPE (T, unsigned, long)                 \
  38   TEST_TYPE (T, signed, int)                    \
  39   TEST_TYPE (T, unsigned, int)                  \
  40   TEST_TYPE (T, signed, short)                  \
  41   TEST_TYPE (T, unsigned, short)                \
  42   TEST_TYPE (T, signed, char)                   \
  43   TEST_TYPE (T, unsigned, char)
  44
  45 TEST_ALL (DEF_INDEX_OFFSET)
  46
  47 /* { dg-final { scan-assembler-times "ld1d\\tz\[0-9\]+.d, p\[0-9\]+/z, \\\[x\[0-9\]+, x\[0-9\]+, lsl 3\\\]" 16 } } */
  48 /* { dg-final { scan-assembler-times "st1d\\tz\[0-9\]+.d, p\[0-9\]+, \\\[x\[0-9\]+, x\[0-9\]+, lsl 3\\\]" 16 } } */
  49 /* { dg-final { scan-assembler-times "ld1w\\tz\[0-9\]+.s, p\[0-9\]+/z, \\\[x\[0-9\]+, x\[0-9\]+, lsl 2\\\]" 16 } } */
  50 /* { dg-final { scan-assembler-times "st1w\\tz\[0-9\]+.s, p\[0-9\]+, \\\[x\[0-9\]+, x\[0-9\]+, lsl 2\\\]" 16 } } */
  51 /* { dg-final { scan-assembler-times "ld1h\\tz\[0-9\]+.h, p\[0-9\]+/z, \\\[x\[0-9\]+, x\[0-9\]+, lsl 1\\\]" 16 } } */
  52 /* { dg-final { scan-assembler-times "st1h\\tz\[0-9\]+.h, p\[0-9\]+, \\\[x\[0-9\]+, x\[0-9\]+, lsl 1\\\]" 16 } } */
  53 /* { dg-final { scan-assembler-times "ld1b\\tz\[0-9\]+.b, p\[0-9\]+/z, \\\[x\[0-9\]+, x\[0-9\]+\\\]" 16 } } */
  54 /* { dg-final { scan-assembler-times "st1b\\tz\[0-9\]+.b, p\[0-9\]+, \\\[x\[0-9\]+, x\[0-9\]+\\\]" 16 } } */