2014-04-15 Richard Biener <rguenther@suse.de>
[official-gcc.git] / gcc / testsuite / gcc.target / nios2 / nios2-builtin-custom.c
blob18399facc00a1dfd2686da371ae0eb439416f92c
1 /* { dg-do compile } */
2 /* { dg-final { scan-assembler "custom" } } */
4 /* This test case used to cause an unrecognizable insn crash. */
6 void foo (void)
8 int offset = __builtin_custom_in(0x1);