gcc/testsuite/gcc.target/mips/dse-1.c

   1 /* { dg-do compile } */
   2 /* { dg-options "-mgp64" } */
   3 /* { dg-skip-if "code quality test" { *-*-* } { "-O0" } { "" } } */
   4
   5 #define TEST(ID, TYPE1, TYPE2)                                  \
   6   union u##ID {                                                 \
   7     TYPE1 m1[sizeof (TYPE2) / sizeof (TYPE1)];                  \
   8     TYPE2 m2;                                                   \
   9   };                                                            \
  10                                                                 \
  11   /* The MIPS16 versions of the shifts we need are too          \
  12      expensive.  */                                             \
  13   TYPE1 __attribute__((nomips16))                               \
  14   f##ID (TYPE2 x, union u##ID *u)                               \
  15   {                                                             \
  16     u->m2 = x;                                                  \
  17     return (u->m1[0]                                            \
  18             + u->m1[sizeof (TYPE2) / sizeof (TYPE1) - 1]);      \
  19   }                                                             \
  20                                                                 \
  21   TYPE1 __attribute__((nomips16))                               \
  22   g##ID (union u##ID *u)                                        \
  23   {                                                             \
  24     u->m2 = 0;                                                  \
  25     return (u->m1[0] | u->m1[1]);                               \
  26   }
  27
  28 TEST (1, unsigned int, unsigned long long);
  29 TEST (2, int, long long);
  30 TEST (3, unsigned short, unsigned long long);
  31 TEST (4, short, long long);
  32 TEST (5, unsigned char, unsigned long long);
  33 TEST (6, signed char, long long);
  34
  35 TEST (7, unsigned short, unsigned int);
  36 TEST (8, short, int);
  37 TEST (9, unsigned char, unsigned int);
  38 TEST (10, signed char, int);
  39
  40 TEST (11, unsigned char, unsigned short);
  41 TEST (12, signed char, short);
  42
  43 /* { dg-final { scan-assembler-not "\tlh\t" } } */
  44 /* { dg-final { scan-assembler-not "\tlhu\t" } } */
  45 /* { dg-final { scan-assembler-not "\tlw\t" } } */
  46 /* { dg-final { scan-assembler-not "\tlwu\t" } } */
  47 /* { dg-final { scan-assembler-not "\tlb\t" } } */
  48 /* { dg-final { scan-assembler-not "\tlbu\t" } } */