gcc/testsuite/gcc.target/aarch64/scalar-vca.c

   1 /* { dg-do run } */
   2 /* { dg-options "-O3 --save-temps" } */
   3
   4 #include <arm_neon.h>
   5
   6 extern void abort (void);
   7 extern float fabsf (float);
   8 extern double fabs (double);
   9
  10 #define NUM_TESTS 8
  11
  12 float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
  13 float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
  14 double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
  15 double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
  16
  17 #define TEST(TEST, CMP, SUFFIX, WIDTH, F)                               \
  18 int                                                                     \
  19 test_fca##TEST##SUFFIX##_float##WIDTH##_t (void)                        \
  20 {                                                                       \
  21   int ret = 0;                                                          \
  22   int i = 0;                                                            \
  23   uint##WIDTH##_t output[NUM_TESTS];                                    \
  24                                                                         \
  25   for (i = 0; i < NUM_TESTS; i++)                                       \
  26     {                                                                   \
  27       float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]);             \
  28       float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]);             \
  29       /* Inhibit optimization of our linear test loop.  */              \
  30       asm volatile ("" : : : "memory");                                 \
  31       output[i] = f1 CMP f2 ? -1 : 0;                                   \
  32     }                                                                   \
  33                                                                         \
  34   for (i = 0; i < NUM_TESTS; i++)                                       \
  35     {                                                                   \
  36       output[i] = vca##TEST##SUFFIX##_f##WIDTH (input_##SUFFIX##1[i],   \
  37                                                 input_##SUFFIX##2[i])   \
  38                                                   ^ output[i];          \
  39       /* Inhibit autovectorization of our scalar test loop.  */         \
  40       asm volatile ("" : : : "memory");                                 \
  41     }                                                                   \
  42                                                                         \
  43   for (i = 0; i < NUM_TESTS; i++)                                       \
  44     ret |= output[i];                                                   \
  45                                                                         \
  46   return ret;                                                           \
  47 }
  48
  49 TEST (ge, >=, s, 32, f)
  50 /* { dg-final { scan-assembler "facge\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
  51 TEST (ge, >=, d, 64, )
  52 /* { dg-final { scan-assembler "facge\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
  53 TEST (gt, >, s, 32, f)
  54 /* { dg-final { scan-assembler "facgt\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
  55 TEST (gt, >, d, 64, )
  56 /* { dg-final { scan-assembler "facgt\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
  57
  58 int
  59 main (int argc, char **argv)
  60 {
  61   if (test_fcages_float32_t ())
  62     abort ();
  63   if (test_fcaged_float64_t ())
  64     abort ();
  65   if (test_fcagts_float32_t ())
  66     abort ();
  67   if (test_fcagtd_float64_t ())
  68     abort ();
  69   return 0;
  70 }
  71
  72 /* { dg-final { cleanup-saved-temps } } */