gcc/testsuite/gcc.target/i386/avx512bw-vptestmw-1.c

   1 /* { dg-do compile } */
   2 /* { dg-options "-mavx512bw -mavx512vl -O2" } */
   3 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%xmm\[0-9\]+\[^\n\]*k\[1-7\]\{%k\[1-7\]\}(?:\n|\[ \\t\]+#)" 1 } } */
   4 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%ymm\[0-9\]+\[^\n\]*k\[1-7\]\{%k\[1-7\]\}(?:\n|\[ \\t\]+#)" 1 } } */
   5 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%zmm\[0-9\]+\[^\n\]*k\[1-7\]\{%k\[1-7\]\}(?:\n|\[ \\t\]+#)" 1 } } */
   6 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%xmm\[0-9\]+\[^\n\]*k\[1-7\](?:\n|\[ \\t\]+#)" 1 } } */
   7 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%ymm\[0-9\]+\[^\n\]*k\[1-7\](?:\n|\[ \\t\]+#)" 1 } } */
   8 /* { dg-final { scan-assembler-times "vptestmw\[ \\t\]+\[^\{\n\]*%zmm\[0-9\]+\[^\n\]*k\[1-7\](?:\n|\[ \\t\]+#)" 1 } } */
   9
  10 #include <immintrin.h>
  11
  12 volatile __m128i x128;
  13 volatile __m256i x256;
  14 volatile __m512i x512;
  15 volatile __mmask8 m8;
  16 volatile __mmask16 m16;
  17 volatile __mmask32 m32;
  18
  19 void extern
  20 avx512bw_test (void)
  21 {
  22   m8 = _mm_test_epi16_mask (x128, x128);
  23   m16 = _mm256_test_epi16_mask (x256, x256);
  24   m32 = _mm512_test_epi16_mask (x512, x512);
  25   m8 = _mm_mask_test_epi16_mask (3, x128, x128);
  26   m16 = _mm256_mask_test_epi16_mask (3, x256, x256);
  27   m32 = _mm512_mask_test_epi16_mask (3, x512, x512);
  28 }