gcc/testsuite/gcc.dg/asm-4.c

   1 /* { dg-do compile } */
   2 /* { dg-options "" } */
   3
   4 int main()
   5 {
   6   int x, y, z;
   7
   8   asm volatile ("test0 X%0Y%[arg]Z" : [arg] "=g" (x));
   9   asm volatile ("test1 X%[out]Y%[in]Z" : [out] "=g" (y) : [in] "0"(y));
  10   asm volatile ("test2 X%a0Y%a[arg]Z" : : [arg] "p" (&z));
  11   asm volatile ("test3 %[in]" : [inout] "=g"(x) : "[inout]" (x), [in] "g" (y));
  12 }
  13
  14 /* { dg-final { scan-assembler {test0 X(.*)Y\1Z} } } */
  15 /* { dg-final { scan-assembler {test1 X(.*)Y\1Z} } } */
  16 /* { dg-final { scan-assembler {test2 X(.*)Y\1Z} } } */