gcc/testsuite/gcc.target/aarch64/sve/scatter_store_5.c

   1 /* { dg-do assemble { target aarch64_asm_sve_ok } } */
   2 /* { dg-options "-O2 -ftree-vectorize --save-temps" } */
   3
   4 #include <stdint.h>
   5
   6 /* Invoked 18 times for each data size.  */
   7 #define TEST_LOOP(DATA_TYPE)                                            \
   8   void __attribute__ ((noinline, noclone))                              \
   9   f_##DATA_TYPE (DATA_TYPE *restrict *dest, DATA_TYPE *restrict src,    \
  10                  int n)                                                 \
  11   {                                                                     \
  12     for (int i = 9; i < n; ++i)                                         \
  13       *dest[i] = src[i] + 1;                                            \
  14   }
  15
  16 #define TEST_ALL(T)                             \
  17   T (int64_t)                                   \
  18   T (uint64_t)                                  \
  19   T (double)
  20
  21 TEST_ALL (TEST_LOOP)
  22
  23 /* { dg-final { scan-assembler-times {\tst1d\tz[0-9]+\.d, p[0-7], \[z[0-9]+.d\]\n} 3 } } */