2 * mtest - Perform a memory test
5 * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
7 * See file CREDITS for list of people who contributed to this
10 * This program is free software; you can redistribute it and/or
11 * modify it under the terms of the GNU General Public License as
12 * published by the Free Software Foundation; either version 2 of
13 * the License, or (at your option) any later version.
15 * This program is distributed in the hope that it will be useful,
16 * but WITHOUT ANY WARRANTY; without even the implied warranty of
17 * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
18 * GNU General Public License for more details.
20 * You should have received a copy of the GNU General Public License
21 * along with this program; if not, write to the Free Software
22 * Foundation, Inc., 59 Temple Place, Suite 330, Boston,
31 * Perform a memory test. A more complete alternative test can be
32 * configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
33 * loops until interrupted by ctrl-c or by a failure of one of the
36 #ifdef CONFIG_CMD_MTEST_ALTERNATIVE
37 static int mem_test(ulong _start
, ulong _end
, ulong pattern_unused
)
39 vu_long
*start
= (vu_long
*)_start
;
40 vu_long
*end
= (vu_long
*)_end
;
51 #ifdef CFG_MEMTEST_SCRATCH
52 vu_long
*dummy
= (vu_long
*)CFG_MEMTEST_SCRATCH
;
54 vu_long
*dummy
= start
;
59 static const ulong bitpattern
[] = {
60 0x00000001, /* single bit */
61 0x00000003, /* two adjacent bits */
62 0x00000007, /* three adjacent bits */
63 0x0000000F, /* four adjacent bits */
64 0x00000005, /* two non-adjacent bits */
65 0x00000015, /* three non-adjacent bits */
66 0x00000055, /* four non-adjacent bits */
67 0xaaaaaaaa, /* alternating 1/0 */
70 /* XXX: enforce alignment of start and end? */
77 printf("Iteration: %6d\r", iterations
);
81 * Data line test: write a pattern to the first
82 * location, write the 1's complement to a 'parking'
83 * address (changes the state of the data bus so a
84 * floating bus doen't give a false OK), and then
85 * read the value back. Note that we read it back
86 * into a variable because the next time we read it,
87 * it might be right (been there, tough to explain to
88 * the quality guys why it prints a failure when the
89 * "is" and "should be" are obviously the same in the
92 * Rather than exhaustively testing, we test some
93 * patterns by shifting '1' bits through a field of
94 * '0's and '0' bits through a field of '1's (i.e.
95 * pattern and ~pattern).
99 if (addr
== dummy
) ++addr
;
100 for (j
= 0; j
< sizeof(bitpattern
)/sizeof(bitpattern
[0]); j
++) {
102 for(; val
!= 0; val
<<= 1) {
104 *dummy
= ~val
; /* clear the test data off of the bus */
106 if(readback
!= val
) {
107 printf ("FAILURE (data line): "
108 "expected 0x%08lx, actual 0x%08lx at address 0x%p\n",
109 val
, readback
, addr
);
114 if(readback
!= ~val
) {
115 printf ("FAILURE (data line): "
116 "Is 0x%08lx, should be 0x%08lx at address 0x%p\n",
117 readback
, ~val
, addr
);
123 * Based on code whose Original Author and Copyright
124 * information follows: Copyright (c) 1998 by Michael
125 * Barr. This software is placed into the public
126 * domain and may be used for any purpose. However,
127 * this notice must not be changed or removed and no
128 * warranty is either expressed or implied by its
129 * publication or distribution.
135 * Description: Test the address bus wiring in a
136 * memory region by performing a walking
137 * 1's test on the relevant bits of the
138 * address and checking for aliasing.
139 * This test will find single-bit
140 * address failures such as stuck -high,
141 * stuck-low, and shorted pins. The base
142 * address and size of the region are
143 * selected by the caller.
145 * Notes: For best results, the selected base
146 * address should have enough LSB 0's to
147 * guarantee single address bit changes.
148 * For example, to test a 64-Kbyte
149 * region, select a base address on a
150 * 64-Kbyte boundary. Also, select the
151 * region size as a power-of-two if at
154 * Returns: 0 if the test succeeds, 1 if the test fails.
156 * ## NOTE ## Be sure to specify start and end
157 * addresses such that addr_mask has
158 * lots of bits set. For example an
159 * address range of 01000000 02000000 is
160 * bad while a range of 01000000
161 * 01ffffff is perfect.
163 addr_mask
= ((ulong
)end
- (ulong
)start
)/sizeof(vu_long
);
164 pattern
= (vu_long
) 0xaaaaaaaa;
165 anti_pattern
= (vu_long
) 0x55555555;
167 debug("%s:%d: addr mask = 0x%.8lx\n",
168 __FUNCTION__
, __LINE__
,
171 * Write the default pattern at each of the
172 * power-of-two offsets.
174 for (offset
= 1; (offset
& addr_mask
) != 0; offset
<<= 1)
175 start
[offset
] = pattern
;
178 * Check for address bits stuck high.
181 start
[test_offset
] = anti_pattern
;
183 for (offset
= 1; (offset
& addr_mask
) != 0; offset
<<= 1) {
184 temp
= start
[offset
];
185 if (temp
!= pattern
) {
186 printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
187 " expected 0x%.8lx, actual 0x%.8lx\n",
188 (ulong
)&start
[offset
], pattern
, temp
);
192 start
[test_offset
] = pattern
;
195 * Check for addr bits stuck low or shorted.
197 for (test_offset
= 1; (test_offset
& addr_mask
) != 0; test_offset
<<= 1) {
198 start
[test_offset
] = anti_pattern
;
200 for (offset
= 1; (offset
& addr_mask
) != 0; offset
<<= 1) {
201 temp
= start
[offset
];
202 if ((temp
!= pattern
) && (offset
!= test_offset
)) {
203 printf ("\nFAILURE: Address bit stuck low or shorted @"
204 " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
205 (ulong
)&start
[offset
], pattern
, temp
);
209 start
[test_offset
] = pattern
;
213 * Description: Test the integrity of a physical
214 * memory device by performing an
215 * increment/decrement test over the
216 * entire region. In the process every
217 * storage bit in the device is tested
218 * as a zero and a one. The base address
219 * and the size of the region are
220 * selected by the caller.
222 * Returns: 0 if the test succeeds, 1 if the test fails.
224 num_words
= ((ulong
)end
- (ulong
)start
)/sizeof(vu_long
) + 1;
227 * Fill memory with a known pattern.
229 for (pattern
= 1, offset
= 0; offset
< num_words
; pattern
++, offset
++) {
230 start
[offset
] = pattern
;
234 * Check each location and invert it for the second pass.
236 for (pattern
= 1, offset
= 0; offset
< num_words
; pattern
++, offset
++) {
237 temp
= start
[offset
];
238 if (temp
!= pattern
) {
239 printf ("\nFAILURE (read/write) @ 0x%.8lx:"
240 " expected 0x%.8lx, actual 0x%.8lx)\n",
241 (ulong
)&start
[offset
], pattern
, temp
);
245 anti_pattern
= ~pattern
;
246 start
[offset
] = anti_pattern
;
250 * Check each location for the inverted pattern and zero it.
252 for (pattern
= 1, offset
= 0; offset
< num_words
; pattern
++, offset
++) {
253 anti_pattern
= ~pattern
;
254 temp
= start
[offset
];
255 if (temp
!= anti_pattern
) {
256 printf ("\nFAILURE (read/write): @ 0x%.8lx:"
257 " expected 0x%.8lx, actual 0x%.8lx)\n",
258 (ulong
)&start
[offset
], anti_pattern
, temp
);
267 static int mem_test(ulong _start
, ulong _end
, ulong pattern
)
270 vu_long
*start
= (vu_long
*)_start
;
271 vu_long
*end
= (vu_long
*)_end
;
284 printf ("\rPattern 0x%08lX Writing..."
286 "\b\b\b\b\b\b\b\b\b\b",
289 for (addr
=start
,val
=pattern
; addr
<end
; addr
++) {
296 for (addr
=start
,val
=pattern
; addr
<end
; addr
++) {
298 if (readback
!= val
) {
299 printf ("\nMem error @ 0x%08X: "
300 "found 0x%08lX, expected 0x%08lX\n",
301 (uint
)addr
, readback
, val
);
308 * Flip the pattern each time to make lots of zeros and
309 * then, the next time, lots of ones. We decrement
310 * the "negative" patterns and increment the "positive"
311 * patterns to preserve this feature.
313 if(pattern
& 0x80000000) {
314 pattern
= -pattern
; /* complement & increment */
325 static int do_mem_mtest(struct command
*cmdtp
, int argc
, char *argv
[])
327 ulong start
, end
, pattern
= 0;
330 return COMMAND_ERROR_USAGE
;
332 start
= simple_strtoul(argv
[1], NULL
, 0);
333 end
= simple_strtoul(argv
[2], NULL
, 0);
336 pattern
= simple_strtoul(argv
[3], NULL
, 0);
338 printf ("Testing 0x%08x ... 0x%08x:\n", (uint
)start
, (uint
)end
);
340 return mem_test(start
, end
, pattern
);
343 static const __maybe_unused
char cmd_mtest_help
[] =
344 "Usage: <start> <end> "
345 #ifdef CONFIG_CMD_MTEST_ALTERNATIVE
348 "\nsimple RAM read/write test\n";
350 BAREBOX_CMD_START(mtest
)
352 .usage
= "simple RAM test",
353 BAREBOX_CMD_HELP(cmd_mtest_help
)