| commit | 4757c55cc5f7babba6abed2a88773eb41b1d92f3 | |
| author | hjl <hjl@138bc75d-0d04-0410-961f-82ee72b054a4> | |
| Tue, 4 Aug 2015 11:54:20 +0000 (4 11:54 +0000) | ||
| committer | hjl <hjl@138bc75d-0d04-0410-961f-82ee72b054a4> | |
| Tue, 4 Aug 2015 11:54:20 +0000 (4 11:54 +0000) | ||
| tree | 93c67cbe40fa60f55a16696999090315c6bab640 | treesnapshot (tar.gz zip) |
| parent | d8cc4c52326c8dff890ac3d5d15fe4e44a50b4db | commitdiff |
Compile IAMCU tests with -fno-pie -no-pie
Since IAMCU tests clear all scratch integer registers with:
asm __volatile__ ("xor %%eax, %%eax\n\t" \
"xor %%edx, %%edx\n\t" \
"xor %%ecx, %%ecx\n\t" \
::: "eax", "edx", "ecx");
PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.
PR target/67110
* gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
-fno-pie -no-pie.
git-svn-id: svn+ssh://gcc.gnu.org/svn/gcc/trunk@226570 138bc75d-0d04-0410-961f-82ee72b054a4
Since IAMCU tests clear all scratch integer registers with:
asm __volatile__ ("xor %%eax, %%eax\n\t" \
"xor %%edx, %%edx\n\t" \
"xor %%ecx, %%ecx\n\t" \
::: "eax", "edx", "ecx");
PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.
PR target/67110
* gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
-fno-pie -no-pie.
git-svn-id: svn+ssh://gcc.gnu.org/svn/gcc/trunk@226570 138bc75d-0d04-0410-961f-82ee72b054a4
| gcc/testsuite/ChangeLog | diffblobblamehistory | |
| gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp | diffblobblamehistory |