From 93ed835928f3100c95e0408df0543f35d03f7c23 Mon Sep 17 00:00:00 2001 From: Carolyn Wyborny Date: Thu, 24 Feb 2011 03:12:15 +0000 Subject: [PATCH] igb: Fix reg pattern test in ethtool for i350 devices This fixes the reg_pattern_test so that the test does not fail on i350 parts. Signed-off-by: Carolyn Wyborny Tested-by: Jeff Pieper Signed-off-by: Jeff Kirsher --- drivers/net/igb/igb_ethtool.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/drivers/net/igb/igb_ethtool.c b/drivers/net/igb/igb_ethtool.c index a70e16bcfa7e..16bbd4922bc3 100644 --- a/drivers/net/igb/igb_ethtool.c +++ b/drivers/net/igb/igb_ethtool.c @@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data, {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; for (pat = 0; pat < ARRAY_SIZE(_test); pat++) { wr32(reg, (_test[pat] & write)); - val = rd32(reg); + val = rd32(reg) & mask; if (val != (_test[pat] & write & mask)) { dev_err(&adapter->pdev->dev, "pattern test reg %04X " "failed: got 0x%08X expected 0x%08X\n", -- 2.11.4.GIT