From 97f3c0ee01057797b10e1d1007cdfbbe6bb460e6 Mon Sep 17 00:00:00 2001 From: ktkachov Date: Tue, 27 Mar 2018 16:52:10 +0000 Subject: [PATCH] [AArch64] XFAIL gcc.target/aarch64/store_v2vec_lanes.c for ILP32 The test in question fails for ilp32. The initial analysis I did in the PR for it is that for ILP32 we generate somewhat different address forms that we'd need to adjust aarch64_classify_address to catch. Given the optimisation this test checks for was added for GCC 8 it is not a regression, and improving the codegen on ILP32 would be an enhancement rather than a fix. So Richi has asked for it to be marked as XFAIL on ILP32, which is what this patch does. Checked that the test still passes on LP64 and appears as XFAIL on -mabi=ilp32. PR target/83009 * gcc.target/aarch64/store_v2vec_lanes.c: XFAIL for ilp32. git-svn-id: svn+ssh://gcc.gnu.org/svn/gcc/trunk@258894 138bc75d-0d04-0410-961f-82ee72b054a4 --- gcc/testsuite/ChangeLog | 5 +++++ gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c | 6 +++--- 2 files changed, 8 insertions(+), 3 deletions(-) diff --git a/gcc/testsuite/ChangeLog b/gcc/testsuite/ChangeLog index 1b566b808c7..269df7ab60d 100644 --- a/gcc/testsuite/ChangeLog +++ b/gcc/testsuite/ChangeLog @@ -1,3 +1,8 @@ +2018-03-27 Kyrylo Tkachov + + PR target/83009 + * gcc.target/aarch64/store_v2vec_lanes.c: XFAIL for ilp32. + 2018-03-27 Ramana Radhakrishnan PR target/81863 diff --git a/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c b/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c index 6810db3c54d..990aea32de6 100644 --- a/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c +++ b/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c @@ -26,6 +26,6 @@ construct_lane_2 (long long *y, v2di *z) values from consecutive memory into a 2-element vector by using a Q-reg LDR. */ -/* { dg-final { scan-assembler-times "stp\td\[0-9\]+, d\[0-9\]+" 1 } } */ -/* { dg-final { scan-assembler-times "stp\tx\[0-9\]+, x\[0-9\]+" 1 } } */ -/* { dg-final { scan-assembler-not "ins\t" } } */ +/* { dg-final { scan-assembler-times "stp\td\[0-9\]+, d\[0-9\]+" 1 { xfail ilp32 } } } */ +/* { dg-final { scan-assembler-times "stp\tx\[0-9\]+, x\[0-9\]+" 1 { xfail ilp32 } } } */ +/* { dg-final { scan-assembler-not "ins\t" { xfail ilp32 } } } */ -- 2.11.4.GIT